Brief biography

Vladimir Riffo is Full Professor in the Department of Computer Engineering and Computer Science at Universidad de Atacama, Copiapó, Chile, where he has been Director in two periods, from 2006 to 2008 and from 2017 to 2018. He received the B.Sc.Eng. degree in electronic engineering from the Universidad de Antofagasta, Antofagasta, Chile, in 1998. The M.Eng. degree, in 2011, and Ph.D. degree in Engineering Sciences, in 2016, both from the Pontificia Universidad Católica de Chile (PUC), Santiago, Chile.
He is an academic collaborator in the XCV Research Lab, PUC. His current research interests include pattern recognition, object detection, automatic visual inspection, computer vision using multiple views and X-ray testing, and the ways to combine those approaches.
He received a scholarship for his Ph.D. studies from the Comisión Nacional de Investigación Científica y Tecnológica (CONICYT) and was a recipient of the Ron Halmshaw Award in 2017 and 2012, also, the John Green Award in 2013 from the British Institute for Non-Destructive Testing, which was established for the best papers published in Insight Journal on Industrial Radiography.

Awards

• The Ron Halmshaw Award for publishing the best paper during 2017 on industrial radiography in journal Insight.

• The John Grimwade Medal for publishing the best paper during 2013 in journal Insight,

• The Ron Halmshaw Award for publishing the best paper during 2012 on industrial radiography in journal Insight.

Graduate students

• M.Sc. Alvaro Olivares,
• M.Sc. Victor Ariza,
• M.Sc. María Camila Mercado.

Alumni

• M.Sc. Rodrigo Hidalgo,
• M.Sc. Alejandro Pulgar,
• M.Sc. Sebastian Flores,
• M.I.T. Manuel Muñoz,
• M.Sc. Ivan Godoy,
• M.Sc. Carlos Carrasco.